Tianshu Hou, Ngai Wong, Quan Chen, Zhigang Ji, Hai-Bao Chen. Analytical Post-Voiding Modeling and Efficient Characterization of EM Failure Effects Under Time-Dependent Current Stressing. IEEE Trans. on CAD of Integrated Circuits and Systems, 42(12):4959-4972, December 2023. [doi]
Abstract is missing.