Tianshu Hou, Ngai Wong, Quan Chen, Zhigang Ji, Hai-Bao Chen. Analytical Post-Voiding Modeling and Efficient Characterization of EM Failure Effects Under Time-Dependent Current Stressing. IEEE Trans. on CAD of Integrated Circuits and Systems, 42(12):4959-4972, December 2023. [doi]
@article{HouWCJC23,
title = {Analytical Post-Voiding Modeling and Efficient Characterization of EM Failure Effects Under Time-Dependent Current Stressing},
author = {Tianshu Hou and Ngai Wong and Quan Chen and Zhigang Ji and Hai-Bao Chen},
year = {2023},
month = {December},
doi = {10.1109/TCAD.2023.3283937},
url = {https://doi.org/10.1109/TCAD.2023.3283937},
researchr = {https://researchr.org/publication/HouWCJC23},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {42},
number = {12},
pages = {4959-4972},
}