Fast Algorithms for Static Compaction of Sequential Circuit Test Vectors - researchr publication authors

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Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel. Fast Algorithms for Static Compaction of Sequential Circuit Test Vectors. In 15th IEEE VLSI Test Symposium (VTS 97), April 27-May 1, 1997, Monterey, California, USA. pages 188-195, IEEE Computer Society, 1997. [doi]

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