Fast Algorithms for Static Compaction of Sequential Circuit Test Vectors - researchr publication related

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Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel. Fast Algorithms for Static Compaction of Sequential Circuit Test Vectors. In 15th IEEE VLSI Test Symposium (VTS 97), April 27-May 1, 1997, Monterey, California, USA. pages 188-195, IEEE Computer Society, 1997. [doi]

The following publications are possibly variants of this publication:

Fast Static Compaction Algorithms for Sequential Circuit Test VectorsMichael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel. TC, 48(3):311-322, 1999.

State Relaxation Based Subsequence Removal for Fast Static Compaction in Sequential CircuitsMichael S. Hsiao, Srimat T. Chakradhar. date 1998: 577-582 [doi]

Partitioning and Reordering Techniques for Static Test Sequence Compaction of Sequential CircuitsMichael S. Hsiao, Srimat T. Chakradhar. ats 1998: 452-457 [doi]

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