Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel. Fast Algorithms for Static Compaction of Sequential Circuit Test Vectors. In 15th IEEE VLSI Test Symposium (VTS 97), April 27-May 1, 1997, Monterey, California, USA. pages 188-195, IEEE Computer Society, 1997. [doi]
@inproceedings{HsiaoRP97:2,
title = {Fast Algorithms for Static Compaction of Sequential Circuit Test Vectors},
author = {Michael S. Hsiao and Elizabeth M. Rudnick and Janak H. Patel},
year = {1997},
url = {http://csdl.computer.org/comp/proceedings/vts/1997/7810/00/78100188abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/HsiaoRP97%3A2},
cites = {0},
citedby = {0},
pages = {188-195},
booktitle = {15th IEEE VLSI Test Symposium (VTS 97), April 27-May 1, 1997, Monterey, California, USA},
publisher = {IEEE Computer Society},
}