The following publications are possibly variants of this publication:
- A New Architecture for Charge Pump Circuit Without Suffering Gate-Oxide Reliability in Low-Voltage CMOS ProcessesTzu-Ming Wang, Wan-Yi Shen, Ming-Dou Ker. icecsys 2007: 206-209 [doi]
- Novel high positive and negative pumping circuits for low supply voltageHongchin Lin, Kai-Hsun Chang, Shyh-Chyi Wong. iscas 1999: 238-241 [doi]
- New four-phase generation circuits for low-voltage charge pumpsHongchin Lin, Nai-Hsien Chen. iscas 2001: 504-507 [doi]
- Ultra-Low-voltage gain-Enhanced Four-phase charge pump without Body effectChanglong Lin, Xinzhuo Sun, Shiliang Ma, Xin Lu, Ke Liang, Guofeng Li. jcsc, 23(7), 2014. [doi]