Identification of Failure Modes for Circuit Samples with Confounded Causes of Failure - researchr publication authors

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Shu-Han Hsu, Ying-Yuan Huang, Kexin Yang, Linda Milor. Identification of Failure Modes for Circuit Samples with Confounded Causes of Failure. In Dimitris Gizopoulos, Dan Alexandrescu, Panagiota Papavramidou, Michail Maniatakos, editors, 25th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2019, Rhodes, Greece, July 1-3, 2019. pages 257-262, IEEE, 2019. [doi]

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