Shu-Han Hsu, Ying-Yuan Huang, Kexin Yang, Linda Milor. Identification of Failure Modes for Circuit Samples with Confounded Causes of Failure. In Dimitris Gizopoulos, Dan Alexandrescu, Panagiota Papavramidou, Michail Maniatakos, editors, 25th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2019, Rhodes, Greece, July 1-3, 2019. pages 257-262, IEEE, 2019. [doi]
@inproceedings{HsuHYM19,
title = {Identification of Failure Modes for Circuit Samples with Confounded Causes of Failure},
author = {Shu-Han Hsu and Ying-Yuan Huang and Kexin Yang and Linda Milor},
year = {2019},
doi = {10.1109/IOLTS.2019.8854409},
url = {https://doi.org/10.1109/IOLTS.2019.8854409},
researchr = {https://researchr.org/publication/HsuHYM19},
cites = {0},
citedby = {0},
pages = {257-262},
booktitle = {25th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2019, Rhodes, Greece, July 1-3, 2019},
editor = {Dimitris Gizopoulos and Dan Alexandrescu and Panagiota Papavramidou and Michail Maniatakos},
publisher = {IEEE},
isbn = {978-1-7281-2490-2},
}