In-Field Testing of NAND Flash Storage: Why and How?

Yu Hu, Xinli Gu, Xiaowei Li 0001. In-Field Testing of NAND Flash Storage: Why and How?. In 21st IEEE Asian Test Symposium, ATS 2012, Niigata, Japan, November 19-22, 2012. pages 69, IEEE Computer Society, 2012. [doi]

Authors

Yu Hu

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Xinli Gu

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Xiaowei Li 0001

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