Yu Hu, Xinli Gu, Xiaowei Li 0001. In-Field Testing of NAND Flash Storage: Why and How?. In 21st IEEE Asian Test Symposium, ATS 2012, Niigata, Japan, November 19-22, 2012. pages 69, IEEE Computer Society, 2012. [doi]
@inproceedings{HuG012,
title = {In-Field Testing of NAND Flash Storage: Why and How?},
author = {Yu Hu and Xinli Gu and Xiaowei Li 0001},
year = {2012},
doi = {10.1109/ATS.2012.71},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2012.71},
researchr = {https://researchr.org/publication/HuG012},
cites = {0},
citedby = {0},
pages = {69},
booktitle = {21st IEEE Asian Test Symposium, ATS 2012, Niigata, Japan, November 19-22, 2012},
publisher = {IEEE Computer Society},
isbn = {978-1-4673-4555-2},
}