In-Field Testing of NAND Flash Storage: Why and How?

Yu Hu, Xinli Gu, Xiaowei Li 0001. In-Field Testing of NAND Flash Storage: Why and How?. In 21st IEEE Asian Test Symposium, ATS 2012, Niigata, Japan, November 19-22, 2012. pages 69, IEEE Computer Society, 2012. [doi]

Abstract

Abstract is missing.