Using Clock-Vdd to Test and Diagnose the Power-Switch in Power-Gating Circuit - researchr publication authors

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Hsiang-Hui Huang, Ching-Hwa Cheng. Using Clock-Vdd to Test and Diagnose the Power-Switch in Power-Gating Circuit. In 25th IEEE VLSI Test Symposium (VTS 2007), 6-10 May 2007, Berkeley, California, USA. pages 110-118, IEEE Computer Society, 2007. [doi]

This author has not been identified. Look up 'Hsiang-Hui Huang' in GoogleThis author has not been identified. Look up 'Ching-Hwa Cheng' in Google

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