Hsiang-Hui Huang, Ching-Hwa Cheng. Using Clock-Vdd to Test and Diagnose the Power-Switch in Power-Gating Circuit. In 25th IEEE VLSI Test Symposium (VTS 2007), 6-10 May 2007, Berkeley, California, USA. pages 110-118, IEEE Computer Society, 2007. [doi]
Abstract is missing.