Hsiang-Hui Huang, Ching-Hwa Cheng. Using Clock-Vdd to Test and Diagnose the Power-Switch in Power-Gating Circuit. In 25th IEEE VLSI Test Symposium (VTS 2007), 6-10 May 2007, Berkeley, California, USA. pages 110-118, IEEE Computer Society, 2007. [doi]
@inproceedings{HuangC07:16,
title = {Using Clock-Vdd to Test and Diagnose the Power-Switch in Power-Gating Circuit},
author = {Hsiang-Hui Huang and Ching-Hwa Cheng},
year = {2007},
doi = {10.1109/VTS.2007.85},
url = {http://dx.doi.org/10.1109/VTS.2007.85},
tags = {testing},
researchr = {https://researchr.org/publication/HuangC07%3A16},
cites = {0},
citedby = {0},
pages = {110-118},
booktitle = {25th IEEE VLSI Test Symposium (VTS 2007), 6-10 May 2007, Berkeley, California, USA},
publisher = {IEEE Computer Society},
}