Design optimization of ESD protection and latchup prevention for a serial I/O IC - researchr publication authors

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Chih-Yao Huang, Wei-Fang Chen, Song-Yu Chuan, Fu-Chien Chiu, Jeng-Chou Tseng, I-Cheng Lin, Chuan-Jane Chao, Len-Yi Leu, Ming-Dou Ker. Design optimization of ESD protection and latchup prevention for a serial I/O IC. Microelectronics Reliability, 44(2):213-221, 2004. [doi]

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