Chih-Yao Huang, Wei-Fang Chen, Song-Yu Chuan, Fu-Chien Chiu, Jeng-Chou Tseng, I-Cheng Lin, Chuan-Jane Chao, Len-Yi Leu, Ming-Dou Ker. Design optimization of ESD protection and latchup prevention for a serial I/O IC. Microelectronics Reliability, 44(2):213-221, 2004. [doi]
Abstract is missing.