Chih-Yao Huang, Wei-Fang Chen, Song-Yu Chuan, Fu-Chien Chiu, Jeng-Chou Tseng, I-Cheng Lin, Chuan-Jane Chao, Len-Yi Leu, Ming-Dou Ker. Design optimization of ESD protection and latchup prevention for a serial I/O IC. Microelectronics Reliability, 44(2):213-221, 2004. [doi]
@article{HuangCCCTLCLK04,
title = {Design optimization of ESD protection and latchup prevention for a serial I/O IC},
author = {Chih-Yao Huang and Wei-Fang Chen and Song-Yu Chuan and Fu-Chien Chiu and Jeng-Chou Tseng and I-Cheng Lin and Chuan-Jane Chao and Len-Yi Leu and Ming-Dou Ker},
year = {2004},
doi = {10.1016/j.microrel.2003.09.008},
url = {http://dx.doi.org/10.1016/j.microrel.2003.09.008},
tags = {optimization, design},
researchr = {https://researchr.org/publication/HuangCCCTLCLK04},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {44},
number = {2},
pages = {213-221},
}