A routability constrained scan chain ordering technique for test power reduction - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

X.-L. Huang, J.-L. Huang. A routability constrained scan chain ordering technique for test power reduction. In Fumiyasu Hirose, editor, Proceedings of the 2006 Conference on Asia South Pacific Design Automation: ASP-DAC 2006, Yokohama, Japan, January 24-27, 2006. pages 648-652, IEEE, 2006. [doi]

This author has not been identified. Look up 'X.-L. Huang' in GoogleThis author has not been identified. Look up 'J.-L. Huang' in Google

runs on WebDSL