A routability constrained scan chain ordering technique for test power reduction

X.-L. Huang, J.-L. Huang. A routability constrained scan chain ordering technique for test power reduction. In Fumiyasu Hirose, editor, Proceedings of the 2006 Conference on Asia South Pacific Design Automation: ASP-DAC 2006, Yokohama, Japan, January 24-27, 2006. pages 648-652, IEEE, 2006. [doi]

Abstract

Abstract is missing.