X.-L. Huang, J.-L. Huang. A routability constrained scan chain ordering technique for test power reduction. In Fumiyasu Hirose, editor, Proceedings of the 2006 Conference on Asia South Pacific Design Automation: ASP-DAC 2006, Yokohama, Japan, January 24-27, 2006. pages 648-652, IEEE, 2006. [doi]
@inproceedings{HuangH06:7,
title = {A routability constrained scan chain ordering technique for test power reduction},
author = {X.-L. Huang and J.-L. Huang},
year = {2006},
doi = {10.1145/1118299.1118453},
url = {http://doi.acm.org/10.1145/1118299.1118453},
tags = {testing},
researchr = {https://researchr.org/publication/HuangH06%3A7},
cites = {0},
citedby = {0},
pages = {648-652},
booktitle = {Proceedings of the 2006 Conference on Asia South Pacific Design Automation: ASP-DAC 2006, Yokohama, Japan, January 24-27, 2006},
editor = {Fumiyasu Hirose},
publisher = {IEEE},
isbn = {0-7803-9451-8},
}