Ying-Yao Huang, Chang-Tzu Lin, Wei-Lun Liang, Hung-Ming Chen. Learning Based Placement Refinement to Reduce DRC Short Violations. In International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2021, Hsinchu, Taiwan, April 19-22, 2021. pages 1-4, IEEE, 2021. [doi]
@inproceedings{HuangLLC21,
title = {Learning Based Placement Refinement to Reduce DRC Short Violations},
author = {Ying-Yao Huang and Chang-Tzu Lin and Wei-Lun Liang and Hung-Ming Chen},
year = {2021},
doi = {10.1109/VLSI-DAT52063.2021.9427321},
url = {https://doi.org/10.1109/VLSI-DAT52063.2021.9427321},
researchr = {https://researchr.org/publication/HuangLLC21},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2021, Hsinchu, Taiwan, April 19-22, 2021},
publisher = {IEEE},
isbn = {978-1-6654-1915-4},
}