Ying-Yao Huang, Chang-Tzu Lin, Wei-Lun Liang, Hung-Ming Chen. Learning Based Placement Refinement to Reduce DRC Short Violations. In International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2021, Hsinchu, Taiwan, April 19-22, 2021. pages 1-4, IEEE, 2021. [doi]
Abstract is missing.