Pulse-Vanishing Test for Interposers Wires in 2.5-D IC

Shi-Yu Huang, Jeo-Yen Lee, Kun-Han Tsai, Wu-Tung Cheng. Pulse-Vanishing Test for Interposers Wires in 2.5-D IC. IEEE Trans. on CAD of Integrated Circuits and Systems, 33(8):1258-1268, 2014. [doi]

Authors

Shi-Yu Huang

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Jeo-Yen Lee

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Kun-Han Tsai

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Wu-Tung Cheng

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