Shi-Yu Huang, Jeo-Yen Lee, Kun-Han Tsai, Wu-Tung Cheng. Pulse-Vanishing Test for Interposers Wires in 2.5-D IC. IEEE Trans. on CAD of Integrated Circuits and Systems, 33(8):1258-1268, 2014. [doi]
@article{HuangLTC14,
title = {Pulse-Vanishing Test for Interposers Wires in 2.5-D IC},
author = {Shi-Yu Huang and Jeo-Yen Lee and Kun-Han Tsai and Wu-Tung Cheng},
year = {2014},
doi = {10.1109/TCAD.2014.2316093},
url = {http://dx.doi.org/10.1109/TCAD.2014.2316093},
researchr = {https://researchr.org/publication/HuangLTC14},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {33},
number = {8},
pages = {1258-1268},
}