Design validation testing of vehicle instrument cluster using machine vision and hardware-in-the-loop

Yingping Huang, Alexandros Mouzakitis, Ross McMurran, Gunwant Dhadyalla, R. Peter Jones. Design validation testing of vehicle instrument cluster using machine vision and hardware-in-the-loop. In IEEE International Conference on Vehicular Electronics and Safety, ICVES 2008, Columbus, OH, USA, 22-24 September, 2008. pages 265-270, IEEE, 2008. [doi]

Abstract

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