Improving the Proportion of At-Speed Tests in Scan BIST

Yu Huang, Irith Pomeranz, Sudhakar M. Reddy, Janusz Rajski. Improving the Proportion of At-Speed Tests in Scan BIST. In Ellen Sentovich, editor, Proceedings of the 2000 IEEE/ACM International Conference on Computer-Aided Design, 2000, San Jose, California, USA, November 5-9, 2000. pages 459-463, IEEE, 2000.

Abstract

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