Reliability Analysis for Flexible Electronics: Case Study of Integrated a-Si: H TFT Scan Driver - researchr publication authors

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Tsung-Ching Huang, Huai-Yuan Tseng, Chen-Pang Kung, Kwang-Ting Cheng. Reliability Analysis for Flexible Electronics: Case Study of Integrated a-Si: H TFT Scan Driver. In Proceedings of the 44th Design Automation Conference, DAC 2007, San Diego, CA, USA, June 4-8, 2007. pages 966-969, IEEE, 2007. [doi]

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