Tsung-Ching Huang, Huai-Yuan Tseng, Chen-Pang Kung, Kwang-Ting Cheng. Reliability Analysis for Flexible Electronics: Case Study of Integrated a-Si: H TFT Scan Driver. In Proceedings of the 44th Design Automation Conference, DAC 2007, San Diego, CA, USA, June 4-8, 2007. pages 966-969, IEEE, 2007. [doi]
Abstract is missing.