Tsung-Ching Huang, Huai-Yuan Tseng, Chen-Pang Kung, Kwang-Ting Cheng. Reliability Analysis for Flexible Electronics: Case Study of Integrated a-Si: H TFT Scan Driver. In Proceedings of the 44th Design Automation Conference, DAC 2007, San Diego, CA, USA, June 4-8, 2007. pages 966-969, IEEE, 2007. [doi]
@inproceedings{HuangTKC07,
title = {Reliability Analysis for Flexible Electronics: Case Study of Integrated a-Si: H TFT Scan Driver},
author = {Tsung-Ching Huang and Huai-Yuan Tseng and Chen-Pang Kung and Kwang-Ting Cheng},
year = {2007},
doi = {10.1109/DAC.2007.375305},
url = {http://doi.ieeecomputersociety.org/10.1109/DAC.2007.375305},
tags = {case study, analysis, reliability},
researchr = {https://researchr.org/publication/HuangTKC07},
cites = {0},
citedby = {0},
pages = {966-969},
booktitle = {Proceedings of the 44th Design Automation Conference, DAC 2007, San Diego, CA, USA, June 4-8, 2007},
publisher = {IEEE},
}