Advanced microprocessor test strategy and methodology

William V. Huott, Timothy J. Koprowski, Bryan J. Robbins, Mary P. Kusko, Stephen Pateras, Dale E. Hoffman, Timothy G. McNamara, Thomas J. Snethen. Advanced microprocessor test strategy and methodology. IBM Journal of Research and Development, 41(4&5):611-628, 1997. [doi]

Authors

William V. Huott

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Timothy J. Koprowski

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Bryan J. Robbins

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Mary P. Kusko

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Stephen Pateras

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Dale E. Hoffman

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Timothy G. McNamara

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Thomas J. Snethen

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