Integrating Scan Design and Soft Error Correction in Low-Power Applications - researchr publication authors

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Michael E. Imhof, Hans-Joachim Wunderlich, Christian G. Zoellin. Integrating Scan Design and Soft Error Correction in Low-Power Applications. In 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece. pages 59-64, IEEE, 2008. [doi]

This author has not been identified. Look up 'Michael E. Imhof' in GoogleThis author has not been identified. Look up 'Hans-Joachim Wunderlich' in GoogleThis author has not been identified. Look up 'Christian G. Zoellin' in Google

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