Michael E. Imhof, Hans-Joachim Wunderlich, Christian G. Zoellin. Integrating Scan Design and Soft Error Correction in Low-Power Applications. In 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece. pages 59-64, IEEE, 2008. [doi]
Abstract is missing.