Integrating Scan Design and Soft Error Correction in Low-Power Applications

Michael E. Imhof, Hans-Joachim Wunderlich, Christian G. Zoellin. Integrating Scan Design and Soft Error Correction in Low-Power Applications. In 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece. pages 59-64, IEEE, 2008. [doi]

@inproceedings{ImhofWZ08,
  title = {Integrating Scan Design and Soft Error Correction in Low-Power Applications},
  author = {Michael E. Imhof and Hans-Joachim Wunderlich and Christian G. Zoellin},
  year = {2008},
  doi = {10.1109/IOLTS.2008.31},
  url = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2008.31},
  tags = {design science, e-science, design},
  researchr = {https://researchr.org/publication/ImhofWZ08},
  cites = {0},
  citedby = {0},
  pages = {59-64},
  booktitle = {14th IEEE International On-Line Testing Symposium (IOLTS 2008), 7-9 July 2008, Rhodes, Greece},
  publisher = {IEEE},
  isbn = {978-0-7695-3264-6},
}