TCAD modeling of encapsulation layer in high-voltage, high-temperature operation regime

I. Imperiale, Susanna Reggiani, Elena Gnani, Antonio Gnudi, Giorgio Baccarani, L. Nguyen, M. Denison. TCAD modeling of encapsulation layer in high-voltage, high-temperature operation regime. In 44th European Solid State Device Research Conference, ESSDERC 2014, Venice Lido, Italy, September 22-26, 2014. pages 325-328, IEEE, 2014. [doi]

Abstract

Abstract is missing.