A class of sequential circuits with combinational test generation complexity under single-fault assumption - researchr publication authors

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Michiko Inoue, Emil Gizdarski, Hideo Fujiwara. A class of sequential circuits with combinational test generation complexity under single-fault assumption. In 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan. pages 398-403, IEEE Computer Society, 2000. [doi]

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