Michiko Inoue, Emil Gizdarski, Hideo Fujiwara. A class of sequential circuits with combinational test generation complexity under single-fault assumption. In 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan. pages 398-403, IEEE Computer Society, 2000. [doi]
@inproceedings{InoueGF00,
title = {A class of sequential circuits with combinational test generation complexity under single-fault assumption},
author = {Michiko Inoue and Emil Gizdarski and Hideo Fujiwara},
year = {2000},
url = {http://csdl.computer.org/comp/proceedings/ats/2000/0887/00/08870398abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/InoueGF00},
cites = {0},
citedby = {0},
pages = {398-403},
booktitle = {9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan},
publisher = {IEEE Computer Society},
isbn = {0-7695-0887-1},
}