Michiko Inoue, Emil Gizdarski, Hideo Fujiwara. A class of sequential circuits with combinational test generation complexity under single-fault assumption. In 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan. pages 398-403, IEEE Computer Society, 2000. [doi]
No references recorded for this publication.
No citations of this publication recorded.