Statistical analysis of dynamic variability in 28nm FD-SOI MOSFETs - researchr publication authors

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Eleftherios G. Ioannidis, Sébastien Haendler, Christoforos Theodorou, Nicolas Planes, C. A. Dimitriadis, Gérard Ghibaudo. Statistical analysis of dynamic variability in 28nm FD-SOI MOSFETs. In 44th European Solid State Device Research Conference, ESSDERC 2014, Venice Lido, Italy, September 22-26, 2014. pages 214-217, IEEE, 2014. [doi]

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