Eleftherios G. Ioannidis, Sébastien Haendler, Christoforos Theodorou, Nicolas Planes, C. A. Dimitriadis, Gérard Ghibaudo. Statistical analysis of dynamic variability in 28nm FD-SOI MOSFETs. In 44th European Solid State Device Research Conference, ESSDERC 2014, Venice Lido, Italy, September 22-26, 2014. pages 214-217, IEEE, 2014. [doi]
@inproceedings{IoannidisHTPDG14,
title = {Statistical analysis of dynamic variability in 28nm FD-SOI MOSFETs},
author = {Eleftherios G. Ioannidis and Sébastien Haendler and Christoforos Theodorou and Nicolas Planes and C. A. Dimitriadis and Gérard Ghibaudo},
year = {2014},
doi = {10.1109/ESSDERC.2014.6948798},
url = {http://dx.doi.org/10.1109/ESSDERC.2014.6948798},
researchr = {https://researchr.org/publication/IoannidisHTPDG14},
cites = {0},
citedby = {0},
pages = {214-217},
booktitle = {44th European Solid State Device Research Conference, ESSDERC 2014, Venice Lido, Italy, September 22-26, 2014},
publisher = {IEEE},
isbn = {978-1-4799-4378-4},
}