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Sandra Irobi, Zaid Al-Ars, Said Hamdioui. Bit line coupling memory tests for single-cell fails in SRAMs. In 28th IEEE VLSI Test Symposium, VTS 2010, April 19-22, 2010, Santa Cruz, California, USA. pages 27-32, IEEE Computer Society, 2010. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Memory Test Optimization for Parasitic Bit Line Coupling in SRAMsSandra Irobi, Zaid Al-Ars, Said Hamdioui. ets 2011: 205 [doi] Detecting memory faults in the presence of bit line coupling in SRAM devicesSandra Irobi, Zaid Al-Ars, Said Hamdioui. itc 2010: 437-446 [doi]
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