Tsutomu Ishida, Izumi Nitta, Koji Banno, Yuzi Kanazawa. A volume diagnosis method for identifying systematic faults in lower-yield wafer occurring during mass production. In 19th Asia and South Pacific Design Automation Conference, ASP-DAC 2014, Singapore, January 20-23, 2014. pages 670-675, IEEE, 2014. [doi]
@inproceedings{IshidaNBK14,
title = {A volume diagnosis method for identifying systematic faults in lower-yield wafer occurring during mass production},
author = {Tsutomu Ishida and Izumi Nitta and Koji Banno and Yuzi Kanazawa},
year = {2014},
doi = {10.1109/ASPDAC.2014.6742968},
url = {http://dx.doi.org/10.1109/ASPDAC.2014.6742968},
researchr = {https://researchr.org/publication/IshidaNBK14},
cites = {0},
citedby = {0},
pages = {670-675},
booktitle = {19th Asia and South Pacific Design Automation Conference, ASP-DAC 2014, Singapore, January 20-23, 2014},
publisher = {IEEE},
}