Built-In Self-Test for Multiple CLB Faults of a LUT Type FPGA - researchr publication authors

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Noriyoshi Itazaki, Fumiro Matsuki, Yasuyuki Matsumoto, Kozo Kinoshita. Built-In Self-Test for Multiple CLB Faults of a LUT Type FPGA. In 7th Asian Test Symposium (ATS 98), 2-4 December 1998, Singapore. pages 272-277, IEEE Computer Society, 1998. [doi]

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