Noriyoshi Itazaki, Fumiro Matsuki, Yasuyuki Matsumoto, Kozo Kinoshita. Built-In Self-Test for Multiple CLB Faults of a LUT Type FPGA. In 7th Asian Test Symposium (ATS 98), 2-4 December 1998, Singapore. pages 272-277, IEEE Computer Society, 1998. [doi]
@inproceedings{ItazakiMMK98,
title = {Built-In Self-Test for Multiple CLB Faults of a LUT Type FPGA},
author = {Noriyoshi Itazaki and Fumiro Matsuki and Yasuyuki Matsumoto and Kozo Kinoshita},
year = {1998},
url = {http://csdl.computer.org/comp/proceedings/ats/1998/8277/00/82770272abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/ItazakiMMK98},
cites = {0},
citedby = {0},
pages = {272-277},
booktitle = {7th Asian Test Symposium (ATS 98), 2-4 December 1998, Singapore},
publisher = {IEEE Computer Society},
isbn = {0-8186-8277-9},
}