Noriyoshi Itazaki, Fumiro Matsuki, Yasuyuki Matsumoto, Kozo Kinoshita. Built-In Self-Test for Multiple CLB Faults of a LUT Type FPGA. In 7th Asian Test Symposium (ATS 98), 2-4 December 1998, Singapore. pages 272-277, IEEE Computer Society, 1998. [doi]
Abstract is missing.