A Unified Approach for SOC Testing Using Test Data Compression and TAM Optimization - researchr publication authors

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Vikram Iyengar, Anshuman Chandra, Sharon Schweizer, Krishnendu Chakrabarty. A Unified Approach for SOC Testing Using Test Data Compression and TAM Optimization. In 2003 Design, Automation and Test in Europe Conference and Exposition (DATE 2003), 3-7 March 2003, Munich, Germany. pages 11188-11190, IEEE Computer Society, 2003. [doi]

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