Vikram Iyengar, Anshuman Chandra, Sharon Schweizer, Krishnendu Chakrabarty. A Unified Approach for SOC Testing Using Test Data Compression and TAM Optimization. In 2003 Design, Automation and Test in Europe Conference and Exposition (DATE 2003), 3-7 March 2003, Munich, Germany. pages 11188-11190, IEEE Computer Society, 2003. [doi]
@inproceedings{IyengarCSC03, title = {A Unified Approach for SOC Testing Using Test Data Compression and TAM Optimization}, author = {Vikram Iyengar and Anshuman Chandra and Sharon Schweizer and Krishnendu Chakrabarty}, year = {2003}, url = {http://csdl.computer.org/comp/proceedings/date/2003/1870/01/187011188abs.htm}, tags = {optimization, testing, data-flow, systematic-approach}, researchr = {https://researchr.org/publication/IyengarCSC03}, cites = {0}, citedby = {0}, pages = {11188-11190}, booktitle = {2003 Design, Automation and Test in Europe Conference and Exposition (DATE 2003), 3-7 March 2003, Munich, Germany}, publisher = {IEEE Computer Society}, isbn = {0-7695-1870-2}, }