Optimized test application timing for AC test

Vijay S. Iyengar, Gopalakrishnan Vijayan. Optimized test application timing for AC test. IEEE Trans. on CAD of Integrated Circuits and Systems, 11(11):1439-1449, 1992. [doi]

Authors

Vijay S. Iyengar

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Gopalakrishnan Vijayan

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