Vijay S. Iyengar, Gopalakrishnan Vijayan. Optimized test application timing for AC test. IEEE Trans. on CAD of Integrated Circuits and Systems, 11(11):1439-1449, 1992. [doi]
@article{IyengarV92,
title = {Optimized test application timing for AC test},
author = {Vijay S. Iyengar and Gopalakrishnan Vijayan},
year = {1992},
doi = {10.1109/43.177406},
url = {http://doi.ieeecomputersociety.org/10.1109/43.177406},
tags = {optimization, testing},
researchr = {https://researchr.org/publication/IyengarV92},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {11},
number = {11},
pages = {1439-1449},
}