Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Vijay S. Iyengar, Gopalakrishnan Vijayan. Optimized test application timing for AC test. IEEE Trans. on CAD of Integrated Circuits and Systems, 11(11):1439-1449, 1992. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: AC Test Quality: Beyond Transition Fault CoverageYaron Aizenbud, Paul Chang, Moshe Leibowitz, Dave Smith, Bernd Könemann, Vijay S. Iyengar, Barry K. Rosen. itc 1992: 568-577 Test Application Timing: The Unexplored Issue in AC TestVijay S. Iyengar, Gopalakrishnan Vijayan. itc 1991: 840-847
The following publications are possibly variants of this publication: