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First and Second Order Piezoresistive Characteristics of CMOS FETs: Weak through Strong Inversion

Richard C. Jaeger, Jeffrey C. Suhling. First and Second Order Piezoresistive Characteristics of CMOS FETs: Weak through Strong Inversion. In 48th European Solid-State Device Research Conference, ESSDERC 2018, Dresden, Germany, September 3-6, 2018. pages 126-129, IEEE, 2018. [doi]

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